IWATSU® Probing Solutions for the Americas

IWATSU® Semiconductor Curve Tracer

■ Precision instruments for analyzing semiconductor devices

■ Supports a wide range of components (transistors, diodes, power devices)

■ High-voltage and high-current sourcing capabilities

■ Includes pulse measurement and low-current analysis features

■ Ideal for device characterization, failure analysis, and quality assurance

■ Suitable for R&D labs, production lines, and educational use

■ Reliable performance tailored for modern semiconductor testing

■ Maximum peak voltage 3,000V (high voltage mode)

■ Maximum peak current 1,000A (CS-3300 high current mode)

■ All models equipped with LEAKAGE mode (1pA cursor resolution)

■ USB port to save screen data and setup data

■ Equipped with LAN interface for remote control

■ Maximum peak voltage 5,000V (high voltage mode)

■ Maximum peak current 1,500A (CS-5400 high current mode)

■ All models equipped with LEAKAGE mode (1pA cursor resolution)

■ USB port to save screen data and setup data

■ Equipped with LAN interface for remote control

■ Up to 5kV, 2kA High-Power Test

■ Very small current measurement (Resolution 250fA）

■ Large 12.1-inch Touch Screen

■ Variety of GATE Signal Output

■ Enhanced Temperature Characteristic Measurement Option

■ On-Wafer High-Power Testing with Wafer-Prober

■ Measurement frequency: 10Hz to 10MHz (SY-8218), 10Hz to 1MHz (SY-8219)

■ Applied waveform: Sine wave, square wave (10Hz - 1MHz)

■ Maximum input current: ±6A

■ Maximum input voltage: ±200V

■ Excitation method: Automatic excitation